年度 2011
論文名稱 Yiming Li and Wei-Hsin Chen, “Effect of Fin Angle on Electrical Characteristics of Nanoscale Bulk FinFETs,” Proceedings of The 2006 NSTI Nanotechnology Conference and Trade Show (NSTI Nanotech 2006), Boston, Massachusetts, U.S.A., May 7-11, 2006, Vol. 3, pp. 20-23.
 
發表日期 2011-08-01