年度 2011
論文名稱 C.C. Su, K.C. Hwang, and S.J. Jou, ``An IDDQ Based Built-in Concurrent Test Technique
for Interconnects in a Boundary Scan Environment," Proc. IEEE Int'l Test Conference,
Washington DC USA, Oct. 1994, pp.670-676.
發表日期 2011-07-20