年度 2011
論文名稱 Hui-Wen Cheng and Yiming Li, “Electrical Characteristic Variability in 16-nm Multi-Gate MOSFET Current Mirror Circuit,” Proceedings of IEEE 2010 International Conference on Enabling Science and Nanotechnology (IEEE ESciNano 2010), Kuala Lumpur, Malaysia, Dec. 1-3, 2010, p. P-48.
發表日期 2011-08-01