年度 2011
論文名稱 K. SM. Li, C.L. Lee, C.C. Su, and J.E. Chen, “A Unified Approach to Detecting Crosstalk
Faults of Interconnected in Deep Submicron VLSI,”Proc. 2004 IEEE Asian Test Symposium,
pp. 145-150.
發表日期 2011-07-20