Year 2011
Paper Title Kuo-Fu Lee, Chih-Hong Hwang, and Yiming Li, “Random-Dopant-Induced Characteristic Fluctuations of Lateral-Asymmetric-Doping-Profile Nano-MOSFET Device and Circuit,” Presented in The 2008 International Electron Devices and Materials Symposia (IEDMS), National Chung Hsing University,Taichung, Taiwan, Nov. 28-29, 2008.
Date of Publication 2011-08-01