年度 2011
论文名称 Ming-Hung Han, Chih-Hong Hwang, and Yiming Li, “Intrinsic-Parameter-Fluctuated Power-Delay Characteristics in 16-nm-Metal-Gate CMOS Devices and Circuit,” Proceedings of The 2009 International Conference on Solid State Devices and Materials (SSDM 2009), Sendai Kokusai Hotel, Miyagi, Japan, Oct.7-9, 2009, pp. 404-405.
发表日期 2011-08-01