年度 2011
論文名稱 Yiming Li, Chien-Sung Lu, Wan-Wen Lo, Meng-Jia Tsai, and Tung-Yu Wu, “Sensitivity Analysis of Static Noise Margin in SRAM Cells with 65 nm CMOS Devices,” Book of Abstract of The 6th International Conference of Scientific Computing in Electrical Engineering (SCEE 2006), Sinaia, Romania, 17-22 September 2006, pp. 21-22.
發表日期 2011-08-01