年度 0000
論文名稱 Yiming Li, Jam-Wem Lee, and H.-M. Chou, "A Comparative Study of Characteristic Variations in Sub-10 nm Double Gate MOSFETs", Proceedings of IEEE 2004 Silicon Nanoelectronics Workshop (IEEE SNW 2004), Hilton Hawaiian Village, Honolulu, HI, June 13-14, 2004, pp. 45-46., 2004年06月
發表日期 1970-01-01