年度 2011
論文名稱 Yiming Li and Shao-Ming Yu, “Random Dopant-Induced Fluctuations of Electrical Characteristics in Nanoscale Single- and Double-Gate MOSFETs,” Book of Abstract of The 6th International Conference of Scientific Computing in Electrical Engineering (SCEE 2006), Sinaia, Romania, 17-22 September 2006, pp.154-155.
發表日期 2011-08-01