年度 2010
论文名称
H. Watanabe, S. Takagi, “Effects of incomplete ionization of impurities in poly-Si gate and band gap narrowing on direct tunneling gate leakage current”, J. Appl. Phys. Vol. 90, no. 3, pp. 1600-1607, 2001.
发表日期 2010-06-08