年度 2010
論文名稱
H. Watanabe, T. Ishihara, Y. Matsunaga, K. Matsuzawa, D. Matsushita, K. Muraoka, “Numerical study of data retention due to direct tunneling for nonvolatile memory cell”, IEEE Trans. Elect. Dev. Vol. 52, no. 5, pp. 955-961, 2005.
發表日期 2010-06-08