Year 2010
Paper Title
 H. Watanabe, D. Matsushita, K. Muraoka, and K. Kato, “Universal tunnel mass and charge trapping in [(SiO2)1-x(Si3N4)x]1-ySiy film”, IEEE Trans. Elec. Dev., vol. 57, no. 5, pp. 1129-1136, 2010.
Date of Publication 2010-12-01