年度 2011
論文名稱 C.W. Lu, C.L. Lee, C.C. Su and J.E. Chen, “Analysis of Application of IDDQ Technique to
the Deep Submicron VLSI Testing,” Journal of Electronic Testing Technology and
Applications (JETTA), 18, pp.89-97, 2002. (SCI)
發表日期 2011-07-20