年度 2015
論文名稱 Pei-Yu Huang and Yu-Min Lee, “An Efficient Method for Analyzing the On-Chip Thermal Reliability with Considering Process Variations,” ACM Transactions on Design Automation of Electronic Systems (TODAES), vol. 18, no. 2, article no. 41, July 2013.
發表日期 2015-07-31