年度 2011
論文名稱 Yiming Li, Hui-Wen Cheng, and Ming-Hung Han, "Statistical Simulation of Static Noise Margin Variability in Static Random Access Memory" , IEEE Transactions on Semiconductor Manufacturing, Vol. 23, No. 4, Nov. 2010, pp. 509-516. (SCI期刊), 2010年11月
發表日期 2011-04-01