年度 2009
論文名稱 Yiming Li, Hung-Ming Chen, Shao-Ming Yu, Jiunn-Ren Hwang, and Fu-Liang Yang, "Strained CMOS Devices with Shallow-Trench-Isolation Stress Buffer Layers" , IEEE Transactions on Electron Devices, Vol. 55, No. 4, Apr. 2008, pp. 1085-1089 (SCI期刊), 2008年04月
發表日期 2009-03-31