年度 2010
论文名称
H. Watanabe, T. Ishihara, Y. Matsunaga, K. Matsuzawa, D. Matsushita, K. Muraoka, “Numerical study of data retention due to direct tunneling for nonvolatile memory cell”, IEEE Trans. Elect. Dev. Vol. 52, no. 5, pp. 955-961, 2005.
发表日期 2010-06-08