年度 2015
全部作者 陈佳宏,Vahid Behravan, Shuo Li, Neil E. Glover, Chia-Hung Chen, Mohammed Shoaib, Gabor C. Temes, Patrick Y. Chiang
论文名称 "A compressed-sensing sensor-on-chip incorporating statistics collection to improve reconstruction performance"
会议名称 IEEE Custom Integrated Circuits Conference (CICC), 2015
地点 San Jose, CA, USA
主办单位 IEEE
参考连结 https://ieeexplore.ieee.org/document/7338429/
发表日期 2015-09-28
ISSN (ISBN) 978-1-4799-8682-8
语言 中文